X-ray inspection apparatus
US8068656B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 15, 2006 |
| Grant date | Nov 29, 2011 |
| Priority date | — |
| Expiry date | May 8, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01G9/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray inspection apparatus includes a sample image obtaining unit, an ideal curve generating unit, a curve adjustment unit, and a mass estimation unit as a function block generated by a control computer. The sample image obtaining unit obtains 10 x-ray transmission images of sample inspected products each of whose mass is known in advance. The ideal curve generating unit generates a table based on a formula that indicates a relationship between the brightness of an area included in the x-ray transmission images and the estimated mass of the area. The curve adjustment unit refers to the input actual mass of each x-ray transmission image and adjusts the table such that the estimated mass approximates the actual mass. The mass estimation unit determines the estimated mass per unit area based on the post-adjusted table and adds up these masses to determine the total estimated mass of the product.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.