LED inspection apparatus and LED inspection method using the same
US8068661B2 · kind B2 · utility
14Cited by
2References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 21, 2008 |
| Grant date | Nov 29, 2011 |
| Priority date | — |
| Expiry date | Apr 18, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/956
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed are a light emitting diode (LED) inspection apparatus, which can determine whether an LED has a defect such as leakage current, without making physical contact with the LED being inspected, and an LED inspection method thereof. The LED inspection apparatus includes an ultraviolet emission unit emitting UV light to an LED, an image generation unit generating an image of the LED to which the UV light is emitted, and a control unit obtaining color or intensity information of the LED from the image of the LED and determining, based on the color information, whether the LED is defective.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.