System and method for measuring a three-dimensional object
US8072450B2 · kind B2 · utility
9Cited by
2References
16Claims
0Family size
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Key dates
| Filing date | Sep 18, 2008 |
| Grant date | Dec 6, 2011 |
| Priority date | — |
| Expiry date | Jul 12, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/521
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system for measuring a three-dimensional object is provided. The system measures differences between a 3D model of an object and a point cloud of the object, and highlights the differences on the 3D model using different colors according to difference ranges that the differences fall.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.