Patent · US Active

Fault testing fault protection device and method

US8072727B2 · kind B2 · utility

6Cited by
2References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 4, 2010
Grant dateDec 6, 2011
Priority date
Expiry dateJul 4, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH02H3/0935
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A fault protection device tests a distribution for persistence of a fault using a selectable first fault testing procedure and a second fault testing procedure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.