Fault testing fault protection device and method
US8072727B2 · kind B2 · utility
6Cited by
2References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 4, 2010 |
| Grant date | Dec 6, 2011 |
| Priority date | — |
| Expiry date | Jul 4, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH02H3/0935
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A fault protection device tests a distribution for persistence of a fault using a selectable first fault testing procedure and a second fault testing procedure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.