Patent · US Active

Method and system for correcting butting artifacts in X-ray images

US8073191B2 · kind B2 · utility

0Cited by

1References

25Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Ti-chiun Chang · Plainsboro, US
Yunqiang Chen · Urbana, US
Tong Fang · Morganville, US
Sandra Martin · Herzogenaurach, DE
Stefan Böhm · Oberasbach, DE
Peter Durlak · Erlangen, DE

Key dates

Filing date	Sep 11, 2008
Grant date	Dec 6, 2011
Priority date	—
Expiry date	Oct 6, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG06V2201/03
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method and system for correcting butting artifacts in x-ray images is disclosed. In order to correct a butting artifact in an x-ray image, a butting artifact region in the x-ray image is normalized. Multiple intensity shift estimators are calculated for each pixel of each line of the butting artifact. Confidence intervals are calculated for each intensity shift estimator. A multiple hypothesis hidden Markov model (MH-HMM) is formulated based on the intensity shift operators and confidence measures subject to a smoothness constraint, and the MH-HMM is solved to determine intensity shift values for each pixel. A corrected image is generated by adjusting the intensity of each pixel of the butting artifact based on the intensity shift value for that pixel.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.