Monitoring gas leakage rates from hermetically sealed devices
US8074491B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 11, 2009 |
| Grant date | Dec 13, 2011 |
| Priority date | — |
| Expiry date | Apr 25, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/00
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method for monitoring a gas leakage rate from a hermetically sealed device, such as a hermetically sealed data storage device with an interior helium atmosphere. In some embodiments, a diffusion rate of inert gas from a hermetically sealed first device is monitored until steady state diffusion is reached, and a standard time constant for the first device is identified. Next, the diffusion rate is monitored for a second sealed device for a portion of the time required for the first device to achieve steady state diffusion, and the time required for the second device to reach steady state diffusion using the standard time constant is calculated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.