Patent · US Active

Illumination system for optical inspection

US8077307B2 · kind B2 · utility

2Cited by
9References
36Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 9, 2008
Grant dateDec 13, 2011
Priority date
Expiry dateNov 30, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/95638
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Apparatus for optical inspection includes an illumination assembly, including multiple parallel rows of light sources for emitting light and illumination optics associated with each row for directing the light onto an object under inspection. The multiple parallel rows include at least a first row with first illumination optics including a first array of prisms that are configured to reflect the light emitted by the light sources in the first row, and at least a second row with second illumination optics including a second array of prisms that are configured to refract the light emitted by the light sources in the second row. An imaging assembly is configured to capture an image of the object under illumination by the multiple parallel rows of the light sources.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.