Patent · US Active

Chemical analyzer for industrial process control

US8077309B2 · kind B2 · utility

10Cited by
15References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 29, 2007
Grant dateDec 13, 2011
Priority date
Expiry dateJan 29, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/067
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An optical apparatus for measurement of industrial chemical processes. The analyzer uses Raman scattering and performs measurement of chemical concentrations in continuous or batch processes. The analyzer operates at a standoff distance from the analyte (or analytes) and can measure concentrations through an optical port, facilitating continuous, non-destructive, and non-invasive analysis without extracting the analyte or analytes from the process. The analyzer can measure one or several solid, liquid, or gaseous analytes, or a mixture thereof.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.