Detecting chemical and biological impurities by nano-structure based spectral sensing
US8081308B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 21, 2009 |
| Grant date | Dec 20, 2011 |
| Priority date | — |
| Expiry date | Jul 14, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/65
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is disclosed for providing quality assurance in an industrial process. The method includes obtaining a manufacturing material from the industrial process, allowing the manufacturing material to contact with a nano-scale surface, which allows the harmful substance to adsorb to the nano-scale surface. The method also includes obtaining a Raman spectrum from the manufacturing material and the nano-scale surface using a spectrometer, searching for, using a spectral analyzer, a spectral signature of a harmful substance in a predetermined spectral region in the Raman spectrum to determine the existence of the harmful substance in the manufacturing material, determining the concentration of the manufacturing material if the spectral signature is found in the Raman spectrum, and rejecting the manufacturing material from the industrial process if the concentration of the manufacturing material is determined to be above a predetermined tolerance level.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.