Diagnosis of problem causes using factorization
US8086899B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2010 |
| Grant date | Dec 27, 2011 |
| Priority date | — |
| Expiry date | Mar 25, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/079
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Technology is described for diagnosing problem causes in complex environments by using factorization of a plurality of features. An embodiment can include the operation of identifying a plurality of entities having entity weighting parameters. The entities may be computing devices. The plurality of features can be associated with a respective entity having feature weighting parameters, and an instance of the plurality of features can be associated with individual entity instances. A fault label can be applied for an ensemble entity. The plurality of features can be linked using the feature weighting parameter and the entity weighting parameter with a bilinear model. A further operation is estimating weighting values for the entity weighting parameters and the feature weighting parameters for use in a statistical model. The meaningful feature parameters can be found for the statistical model that are likely to be responsible for entity faults.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.