Patent · US Active

Method for manufacturing bonded substrate with sandblast treatment

US8088670B2 · kind B2 · utility

7Cited by
5References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 14, 2008
Grant dateJan 3, 2012
Priority date
Expiry dateApr 14, 2028

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/60
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

When manufacturing a bonded substrate using an insulator substrate as a handle wafer, there is provided a method for manufacturing a bonded substrate which can be readily removed after carried and after mounted by roughening a back surface of the bonded substrate (corresponding to a back surface of the insulator substrate) and additionally whose front surface can be easily identified like a process of a silicon semiconductor wafer in case of the bonded substrate using a transparent insulator substrate as a handle wafer. There is provided a method for manufacturing a bonded substrate in which an insulator substrate is used as a handle wafer and a donor wafer is bonded to a front surface of the insulator substrate, the method comprises at least that a sandblast treatment is performed with respect to a back surface of the insulator substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.