Projection device for patterned illumination and microscopy
US8089691B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 21, 2008 |
| Grant date | Jan 3, 2012 |
| Priority date | — |
| Expiry date | Aug 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/00
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A projection and detector device that attaches externally to the photo-port of a widefield microscope. The device includes a light source interface for receiving of illumination from a light source, the illumination defining an illumination path. A pattern mask is located within the illumination path for projecting one or a plurality of objects, structures, or patterns onto a sample located at the object plane of the optical microscope. The pattern mask may be used with structured illumination microscopy (SIM) to project a moving striped optical grid pattern or Ronchi Ruling onto the sample at the object plane in either fluorescence or reflected brightfield imaging. A mechanical or digital diaphragm may also be used, for techniques such as Fluorescence Recovery After Photobleaching (FRAP), fluorescence photoactivation, and targeted illumination. A computer linked with a charged coupled device (CCD) camera may be used to capture images for storage and further post-processing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.