Patent · US Active

Apparatus and method for testing electronic apparatuses

US8090569B2 · kind B2 · utility

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5References
9Claims
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Key dates

Filing dateJan 8, 2009
Grant dateJan 3, 2012
Priority date
Expiry dateSep 10, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/261
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for testing electronic apparatuses is provided. The method includes: reading an identification (ID) of an emulator adapter; searching for the script name in a test table according to the ID; fetching the script from a storage according to the determined script name and running the fetched script to pass each of input commands; and receiving and identifying each of the input commands to simulate a key input via an electrical conductive path, correspondingly to the input command, of the emulator adapter, such that an input key corresponding to the key input of the to-be-tested electronic apparatus is activated and the to-be-tested electronic apparatus performs a function associated with the input key correspondingly. A related test apparatus is also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.