Nondestructive inspection apparatus and nondestructive inspection method using guided wave
US8091427B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 21, 2008 |
| Grant date | Jan 10, 2012 |
| Priority date | — |
| Expiry date | Nov 14, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2634
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed herein are an apparatus and a technique for quickly detecting a defective portion including wastage, which has occurred in piping having a straight piping portion or a bending zone, in the nondestructive inspection using a guided wave. A guided wave sensor 3 included in a guided wave inspection device 4 is mounted to the outer surface of piping 1. A guided wave is propagated to an inspection area of the piping 1. If a defective portion exists, the guided wave sensor 3 receives the guided wave that has been reflected from the defective portion. As a result, the guided wave inspection device 4 can acquire receive information including receive information derived from the defect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.