Method and device for measuring phase noise

US8093909B2 · kind B2 · utility

Assignee

• Rohde & Schwarz GmbH & Co. KG · DE

Inventors

• Wolfgang Wendler · Puchheim, DE
• Alexander Roth · Griesheim, DE
• Hagen Eckert · Mering, DE

Key dates

• Filing date: Feb 7, 2008
• Grant date: Jan 10, 2012
• Expiry date: Nov 26, 2029

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R29/26
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and a device for measuring the phase noise of a signal registers the measurement signal (V) with a given measurement frequency (f1) and with a superimposed phase noise (f1(t)), divides the measurement signal (V) into a first and second measurement signal (V1′, V2′), derives a first signal (V1) with a first frequency ((f1+f1(t))/N) reduced relative to the measurement frequency (f1) and the superimposed phase noise (f1(t)) and a second signal (V2) with a second frequency ((f1+f1(t))/M) reduced relative to the measurement frequency (f1) and the superimposed phase noise (f1(t)), determines a third signal (V3) with a third frequency (f3(t)) compensated by the measurement frequency (f1) relative to the first frequency ((f1+f1(t))/N) of the first signal (V1) and a fourth signal (V4) with a fourth frequency (f4(t)) compensated by the measurement frequency (f1) relative to the second frequency ((f1+f1(t))/M) of the second signal (V2) and determines a correlation spectrum from the third and fourth signal (V3, V4). The frequencies of the third and fourth signal (V3, V4) come to be disposed in each case within the frequency range of the correlation spectrum as a result of the frequenc…