Monitoring of interconnect reliability using a programmable device
US8093921B2 · kind B2 · utility
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9References
8Claims
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Key dates
| Filing date | Feb 13, 2009 |
| Grant date | Jan 10, 2012 |
| Priority date | — |
| Expiry date | Jun 4, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/54
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In one embodiment, the reliability of the L2 power and/or ground sub-arrays of contacts of a functional integrated circuit device is verified by applying a reference voltage to a selected contact in sub-array and sequentially measuring the voltage at other contacts in the sub-array. If the voltage levels are greater than a threshold voltage level then the functional integrated circuit device is verified as being reliable.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.