Method and apparatus for detecting embedded material within an interaction region of a structure
US8094303B2 · kind B2 · utility
9Cited by
82References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 7, 2011 |
| Grant date | Jan 10, 2012 |
| Priority date | — |
| Expiry date | Jan 7, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/28
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
A detection system is used during irradiation of an interaction region of a structure with laser light. The structure includes embedded material. The detection system includes means for receiving light emitted from the interaction region. The detection system further includes means for separating the received light into a spectrum of wavelengths. The detection system further includes means for analyzing at least a portion of the spectrum for indications of embedded material within the interaction region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.