Method for assessing image quality
US8094945B2 · kind B2 · utility
2Cited by
6References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 5, 2006 |
| Grant date | Jan 10, 2012 |
| Priority date | — |
| Expiry date | Apr 29, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention is a method for assessing image quality value of a distorted image with respect to a reference image. The method comprises the following steps:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.