Systems and methods for parametric mapping for correction of noise-based systematic bias of DTI metrics, using a DTI mapping phantom
US8098068B2 · kind B2 · utility
4Cited by
22References
20Claims
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Key dates
| Filing date | Jan 15, 2009 |
| Grant date | Jan 17, 2012 |
| Priority date | — |
| Expiry date | Oct 25, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/58
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for minimizing, if not completely eliminating, the systematic bias present in an MR system used for DTI is disclosed. A test object or “phantom” of the present invention is scanned with a desired DTI protocol. The eigenvalues measured with the phantom are compared to the actual values that should have been measured, and a parametric map that links measured eigenvalues to actual eigenvalues is calculated, which is applicable to the desired protocol. Future eigenvalue measurements using this protocol can be recalibrated to actual eigenvalues using this map.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.