Device and method for time-delayed integration on an X-ray detector composed of a plurality of detector modules
US8098795B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 29, 2009 |
| Grant date | Jan 17, 2012 |
| Priority date | — |
| Expiry date | Mar 3, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/00
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
An X-ray detector for recording an image of an object that is moving relative to the detector includes a plurality of detector modules which are adjacently disposed so that they partially overlap. Using the detector modules, a TDI (Time Delayed Integration) is performed within each detector module. Subsequently an evaluation unit determines corrected measurement values of an overlap region by adding the measured values from the individual detector modules in the overlap region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.