Methods and apparatus for spatially resolved photocurrent mapping of operating photovoltaic devices using atomic force photovoltaic microscopy
US8099792B1 · kind B1 · utility
5Cited by
9References
19Claims
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Key dates
| Filing date | Jan 7, 2009 |
| Grant date | Jan 17, 2012 |
| Priority date | — |
| Expiry date | Dec 22, 2029 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E10/549
- WIPO fieldMicro-structural and nano-technology
- WIPO sectorChemistry
Abstract
Atomic force photovoltaic microscopy apparatus and related methodologies, as can be used to quantitatively measure spatial performance variations in functioning photovoltaic devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.