Patent · US Active

Analysis method for image data records including automatic specification of analysis regions

US8103067B2 · kind B2 · utility

1Cited by

6References

21Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Jan Boese · Eckental, DE
Estelle Camus · Erlangen, DE
Marcus Pfister · Bubenreuth, DE
Thomas Redel · Baiersdorf, DE

Key dates

Filing date	Jun 21, 2007
Grant date	Jan 24, 2012
Priority date	—
Expiry date	Dec 6, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG06V2201/03
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

There is described an analysis method for at least one image data record of an examination object, wherein each image data record features a multiplicity of image data elements. A position in a multidimensional space is assigned to each image data element. Each image data element features an image data value. The image data values of positionally corresponding image data elements of the image data records are specified by means of at least essentially positionally identical regions of the examination object. A computer automatically divides the image data records into empty regions and signal regions, applying an overall assignment rule which is based on the image data values of the image data elements of a plurality of image data records, such that each image data element of each image data record is assigned to either its empty region or its signal region. For each image data record, the computer automatically determines a closed outline which fully contains the signal region of the relevant image data record and, on the basis of the closed outline of the relevant image data record, determines an analysis region such that a further analysis of the relevant image data record can b…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.