Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life

US8103463B2 · kind B2 · utility

Assignee

• IMPACT TECHNOLOGIES, LLC · US

Inventors

• Patrick W. Kalgren · Conesus, US
• Antonio Ginart · Marietta, US
• Sashank Nanduri · Ann Arbor, US
• Anthony J. Boodhansingh · Webster, US
• Carl Byington · Pittsford, US
• Rolf Orsagh · Rochester, US
• Brian J. Sipos · Rochester, US
• Douglas W. Brown · San Diego, US
• Christopher M. Minnella · Middlesex, US
• Mark Baybutt · Webster, US

Key dates

• Filing date: Sep 21, 2007
• Grant date: Jan 24, 2012
• Expiry date: Sep 8, 2029

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2834
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Disclosed are systems and methods for prognostic health management (PHM) of electronic systems. Such systems and methods present challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. The systems and methods are directed to the health monitoring and failure prediction of electronic systems, including the diagnostic methods employed to assess current health state and prognostic methods for the prediction of electronic system failures and remaining useful life. The disclosed methodologies include three techniques: (1) use of existing electronic systems data (circuit as a sensor); (2) use of available external measurements as condition indicators and degradation assessor; and (3) performance assessment metrics derived from available external measurements.