Field mounting-type test apparatus and method for testing memory component or module in actual PC environment
US8103927B2 · kind B2 · utility
1Cited by
7References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 9, 2009 |
| Grant date | Jan 24, 2012 |
| Priority date | — |
| Expiry date | Sep 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/263
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A field mounting-type test apparatus and method for enhancing competitiveness of a product by simulating various test conditions including a mounting environment for improving quality reliability of a memory device and by minimizing overall loss due to change in a mounting environment thus reducing testing time and cost. The field mounting-type test apparatus includes a mass storage device configured to store logic data simulating a mounting environment of a device under test (DUT) and a tester main frame configured to test the DUT using the logic data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.