Charged particle irradiation system and irradiation planning equipment
US8106371B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 1, 2010 |
| Grant date | Jan 31, 2012 |
| Priority date | — |
| Expiry date | Jul 24, 2030 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61N2005/1095
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
In a charged particle irradiation system, forming a uniform dose distribution is required by irradiating a moving irradiation object through beam scanning and energy stacking. The charged particle irradiation system includes an ion beam generator 1 from which an ion beam is extracted with a target beam current value thereof set; an irradiation nozzle 21 having scanning magnets 23, 24 and an energy filter 26, the irradiation nozzle 21 for irradiating an irradiation object with the ion beam; and an irradiation object monitoring unit 66 for measuring a position of the irradiation object and outputting signals that vary with time according to displacement of the irradiation object. The charged particle irradiation system determines extraction timing of the ion beam based on the signal outputted from the irradiation object monitoring unit 66 and sequentially changes energies of the ion beam to thereby perform a repainting irradiation with each of the energies.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.