Testing an electrical component
US8106666B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 12, 2009 |
| Grant date | Jan 31, 2012 |
| Priority date | — |
| Expiry date | Apr 17, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R15/183
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Testing an electrical component, the component including a printed circuit board (‘PCB’) with a number of traces, the traces organized in pairs with each trace of a pair carrying current in opposite directions and separated from one another by a substrate layer of the PCB, where testing of the electrical component includes: dynamically and iteratively until a present impedance for a pair of traces of the component is greater than a predetermined threshold impedance: increasing, by an impedance varying device at the behest of a testing device, magnetic field strength of a magnetic field applied to the pair of traces by the impedance varying device, including increasing the present impedance of the pair of traces; measuring, by the testing device, one or more operating parameters; and recording, by the testing device, the measurements of the operating parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.