Patent · US Active

Knee probe having reduced thickness section for control of scrub motion

US8111080B2 · kind B2 · utility

16Cited by
180References
68Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 3, 2010
Grant dateFeb 7, 2012
Priority date—
Expiry dateFeb 3, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/07357
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An improved knee probe for probing electrical devices and circuits is provided. The improved knee probe has a reduced thickness section to alter the mechanical behavior of the probe when contact is made. The reduced thickness section of the probe makes it easier to deflect the probe vertically when contact is made. This increased ease of vertical deflection tends to reduce the horizontal contact force component responsible for the scrub motion, thereby decreasing scrub length. Here “thickness” is the probe thickness in the deflection plane of the probe (i.e., the plane in which the probe knee lies). The reduced thickness probe section provides increased design flexibility for controlling scrub motion, especially in combination with other probe parameters affecting the scrub motion.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.