Methods and systems for wheel profile measurement
US8111387B2 · kind B2 · utility
23Cited by
17References
28Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 8, 2009 |
| Grant date | Feb 7, 2012 |
| Priority date | — |
| Expiry date | Feb 10, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2210/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and systems for determining a parameter of a vehicle wheel are provided. The vehicle wheel is mounted on a shaft having an axis of rotation. The method includes projecting a pattern onto the wheel wherein the pattern includes a plurality of discrete optically detectable elements and determining a dimensional parameter of the wheel utilizing at least two of the plurality of discrete elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.