Optical sensing based on overlapping optical modes in optical resonator sensors and interferometric sensors
US8111402B2 · kind B2 · utility
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56References
30Claims
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Key dates
| Filing date | Apr 3, 2009 |
| Grant date | Feb 7, 2012 |
| Priority date | — |
| Expiry date | Feb 16, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/7789
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques and devices based on transverse magnetic (TM) and transverse electric (TE) modes in an optical resonator or interferometer to provide sensitive optical detection with insensitivity to a change in temperature. A shift in a difference between a first resonance wavelength of a TE optical mode and a second resonance wavelength of a TM optical mode is measured to measure a change in a sample that is in optical interaction with the optical resonator or interferometer. For example, the detected shift can be used to measure a change in a refractive index of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.