Automated system problem diagnosing
US8112667B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 25, 2010 |
| Grant date | Feb 7, 2012 |
| Priority date | — |
| Expiry date | Jan 25, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/334
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of the invention relate to automated system problem diagnosing. An index is created with problem description information of previously diagnosed problems, a diagnosis for each problem, and a solution to each diagnosis. System states, traces and logs are extracted from a source system with a new problem. The problem diagnosis system generates problem description information of the new problem from the system states, traces and logs. Problem description information of the new problem is compared with problem description information in the problem description index. A search score is computed for each document in the problem description index. The search score is a measure of similarity between each document in the index and the description of the new problem. A matching score is assigned to each previously diagnosed problems based on the search score. The matching score is a measure of similarity between the new problem and each previously diagnosed problem. The system determines a diagnosis and solution of the new problem based on a diagnosis and solution of one of the previously diagnosed problems.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.