System and application debugging
US8112683B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 4, 2008 |
| Grant date | Feb 7, 2012 |
| Priority date | — |
| Expiry date | Jan 28, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/267
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, apparatuses, and methods for system and application debugging are described herein. A tested platform may include a debug event monitor in a boundary scan interface that detects a debug event in a process and determines a characteristic associated with the debug event. The debug event monitor may trigger an application debug event or a boundary scan debug event based at least in part on the determined characteristic. Other embodiments may be described and claimed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.