Patent · US Active

Methods and apparatus for analyzing samples and collecting sample fractions

US8115930B2 · kind B2 · utility

10Cited by

31References

22Claims

0Family size

Assignee

Alltech, Inc. · US

Inventors

James M. Anderson · Cohoes, US
Raaidah Saari-Nordhaus · Antioch, US
Washington Mendoza · Lake in the Hills, US
Josef Bystron · Chicago, US
Dirk Helgemo · Shakopee, US
Sheldon Nelson · New Hope, US
Bruce D. Black · Napa, US
Neil R. Picha · Petaluma, US
Dennis K. Mc Creary · Greencastle, US
Carl H. Poppe · Sebastopol, US

Key dates

Filing date	Dec 4, 2008
Grant date	Feb 14, 2012
Priority date	—
Expiry date	Dec 4, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01N2030/621
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Methods and apparatus for analyzing a sample using at least one detector are disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.