Patent · US Active

Interferometer for optically measuring an object

US8115933B2 · kind B2 · utility

2Cited by
3References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 28, 2010
Grant dateFeb 14, 2012
Priority date
Expiry dateApr 28, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B5/32
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An interferometer for optically measuring an object (10), including a light source (1), at least one beam splitter (2) and at least one detector (12a, 12b), with the beam splitter being arranged in the beam path of the light source such that a light beam created by the light source is split into a working beam (3) and a reference beam (4). The interferometer is embodied such that the working beam impinges on the object (10) to be measured and the working beam is at least partially reflected by the object and interfered with the reference beam on the detector (12a, 12b). Here it is essential that the interferometer is provided with a spatial light modulator, which comprises a hologram control unit (9) and a hologram reconstruction unit (8) connected thereto, with the hologram reconstruction unit being arranged in the beam path of the working beam between the beam splitter (2) and the object (10) and the hologram control unit (9) controlling the hologram reconstruction unit (8) such that the hologram reconstruction unit creates an optionally predetermined hologram such that the working beam is deflected and/or split by the hologram reconstruction unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.