Patent · US Active

Test element analysis system

US8119069B2 · kind B2 · utility

2Cited by
19References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 7, 2010
Grant dateFeb 21, 2012
Priority date
Expiry dateOct 7, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/7703
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test element analysis system for the analytical investigation of a liquid sample, comprising a test element including a carrier film having at least one flat side and a test field secured to the flat side and an evaluation instrument including a test element holder for positioning a test element in a measuring position, a measuring device for measuring the optically measurable change in the detection zone, and a housing within the measuring device is positioned. The test element is positioned in the measuring position in such a manner that a first partial section of the test element is located inside the housing and a second partial section is located outside of the housing to be easily accessible.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.