Test element analysis system
US8119069B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 7, 2010 |
| Grant date | Feb 21, 2012 |
| Priority date | — |
| Expiry date | Oct 7, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/7703
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test element analysis system for the analytical investigation of a liquid sample, comprising a test element including a carrier film having at least one flat side and a test field secured to the flat side and an evaluation instrument including a test element holder for positioning a test element in a measuring position, a measuring device for measuring the optically measurable change in the detection zone, and a housing within the measuring device is positioned. The test element is positioned in the measuring position in such a manner that a first partial section of the test element is located inside the housing and a second partial section is located outside of the housing to be easily accessible.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.