Patent · US Active

Coupling between free space and optical waveguide using etched coupling surfaces

US8121450B2 · kind B2 · utility

34Cited by
31References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 11, 2008
Grant dateFeb 21, 2012
Priority date
Expiry dateMar 22, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B6/327
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A plasma-based etching process is used to specifically shape the endface of an optical substrate supporting an optical waveguide into a contoured facet which will improve coupling efficiency between the waveguide and a free space optical signal. The ability to use standard photolithographic techniques to pattern and etch the optical endface facet allows for virtually any desired facet geometry to be formed—and replicated across the surface of a wafer for the entire group of assemblies being fabricated. A lens may be etched into the endface using a properly-defined photolithographic mask, with the focal point of the lens selected with respect to the parameters of the optical waveguide and the propagating free space signal. Alternatively, an angled facet may be formed along the endface, with the angle sufficient to re-direct reflected/scattered signals away from the optical axis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.