Shape defect factor identification method, device, and program
US8126658B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 24, 2007 |
| Grant date | Feb 28, 2012 |
| Priority date | — |
| Expiry date | Dec 6, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2113/22
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Provided is a method for rapidly, surely, and easily identifying a factor of a shape defect of an artifact attributed to elastic recovery of deformation upon molding by using the numeric value simulation technique, thereby eliminating lowering of dimension accuracy. The method includes a step of calculating a stress distribution and distortion distribution working on an artifact before elastic recovery; a step of calculating a deformation amount δ0 based on the elastic recovery of an evaluation point when the stress distribution is given to the artifact shape before the elastic recovery; a step of dividing the artifact shape into a plurality of regions and calculating a deformation amount δn based on the elastic recovery of the evaluation point when the stress distribution is given to each of the regions of the artifact shape before the elastic recovery; and a step of comparing the deformation amount δ0 and the deformation amount δn and identifying a region where the difference between them is minimum as a main affect region, i.e., a stress distribution region which most affects the shape defect of the evaluation point before and after the elastic recovery.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.