System, method, and apparatus for correction of dark current error in semiconductor imaging devices
US8130289B2 · kind B2 · utility
1Cited by
5References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 25, 2008 |
| Grant date | Mar 6, 2012 |
| Priority date | — |
| Expiry date | Mar 5, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/63
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Detection cells configured to output signals for dark current error correction. Various embodiments of detection cells accumulate dark charge supplied by dark current sources, and output dark charge signals indicating the amount of accumulated dark charge. The dark charge signals may be used to approximate the amount of dark charge read out by pixel cells of an imaging array and/or to offset portions of pixel cell signals attributable to dark charge accumulation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.