Method of calibrating reflection characteristic measuring apparatus for sheet specimen
US8130371B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 19, 2011 |
| Grant date | Mar 6, 2012 |
| Priority date | — |
| Expiry date | May 19, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/55
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.