High-resolution, active-optic X-ray fluorescence analyzer
US8130902B2 · kind B2 · utility
1Cited by
12References
19Claims
0Family size
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Key dates
| Filing date | Jul 31, 2007 |
| Grant date | Mar 6, 2012 |
| Priority date | — |
| Expiry date | Mar 6, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2201/067
- WIPO fieldEngines, pumps, turbines
- WIPO sectorMechanical engineering
Abstract
Active optics apparatus and method for aligning active optics are provided for a high-resolution, active optic fluorescence analyzer combining a large acceptance solid angle with wide energy tunability. A plurality of rows of correctors selectively controlled to bend an elongated strip of single crystal material like Si (400) into substantially any precisely defined shape. A pair of pushers engages opposite ends of the silicon crystal strip exert only a force along the long axis of the crystal strip, and does not induce additional bending moments which would result in a torsion of the crystal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.