Method and system for identifying defects in NDT image data
US8131107B2 · kind B2 · utility
27Cited by
11References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 12, 2008 |
| Grant date | Mar 6, 2012 |
| Priority date | — |
| Expiry date | May 24, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An anomaly detection method includes acquiring image data corresponding to nondestructive testing (NDT) of a scanned object. The NDT image data comprises at least one inspection test image of the scanned object and multiple reference images for the scanned object. The anomaly detection method further includes generating an anomaly detection model based on a statistical analysis of one or more image features in the reference images for the scanned object and identifying one or more defects in the inspection test image, based on the anomaly detection model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.