Long data record analysis
US8131489B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 27, 2006 |
| Grant date | Mar 6, 2012 |
| Priority date | — |
| Expiry date | Sep 8, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/029
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A data analysis technique for a long data record in a memory uses a reference, either user-provided or calculated from the data in the long data record, as a representative event. Each event in the long data record is compared with the reference to determine whether there are significant deviations from the reference. Those events having significant deviations are identified as events of particular interest for a user. The reference may be either a waveform shape or a mean time interval between events. A tolerance value may be added to the waveform reference and varied for dynamic limit testing. Events that are outside the waveform reference as modified by the tolerance value are identified as outliers and may be reduced to iconic images for display simultaneously with the long data record and a selected one of the outliers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.