Method and system for simulating test instruments and instrument functions

US8131529B2 · kind B2 · utility

Assignee

• Advanced Testing Technologies, Inc. · US

Inventors

• Robert Spinner · East Northport, US
• Eli Levi · Dix Hills, US
• William Harold Leippe · Coram, US
• Emery Korpi · Syosset, US
• Michael Lai · Santa Clara, US
• James Kuveikis · Bohemia, US
• Richard E. Chalmers · Northport, US
• Richard Engel · Ridge, US
• Peter F Britch · Miller Place, US
• William Biagiotti · Smithtown, US
• David Howell · Smithtown, US

Key dates

• Filing date: Sep 1, 2006
• Grant date: Mar 6, 2012
• Expiry date: Apr 15, 2029

Classification

• Technology area (CPC G): Physics
• CPC primary: G16H50/50
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.