Patent · US Active

System and method for locating a fault on a device under test

US8132052B2 · kind B2 · utility

1Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 12, 2008
Grant dateMar 6, 2012
Priority date—
Expiry dateJun 12, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2836
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

System and method for analyzing operation of a device under test (DUT). In one embodiment, a reference component associated with a reference device may be received. The reference device may be in communication with the DUT and a component associated with the DUT can be exchanged with the reference component. A test may be performed on the DUT, wherein a result of the test may correspond to a source of a fault associated with the DUT. An indication of the source of the fault may be provided based on the test result.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.