Patent · US Active

Universal testing machine

US8132447B2 · kind B2 · utility

1Cited by

3References

53Claims

0Family size

Inventors

Shaoming Wu · Thousand Oaks, US
Richard Wu · Thousand Oaks, US

Key dates

Filing date	Apr 9, 2010
Grant date	Mar 13, 2012
Priority date	—
Expiry date	Sep 8, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG01N2203/0098
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A testing machine includes a stand and a test device. The stand includes a base, box frame, a slide device driven to slide by a motor, and a control system controls the force applied on the test specimen. The test device is coupled at the slide device for performing various hardness tests consisting of Rockwell hardness test, Vickers hardness test, Brinell hardness test, micro-hardness test, and tension-compression test. The test device includes a force sensor and a data processing circuit converting an analog signal of the force sensor into digital data to interface with the control system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.