Apparatus and method for monitoring wear of components
US8132467B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 15, 2008 |
| Grant date | Mar 13, 2012 |
| Priority date | — |
| Expiry date | Jul 28, 2029 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A structure and method for instrumenting a component for monitoring wear in a coating. The method includes depositing a first thin layer of electrically insulating material, depositing a thin electrically conductive layer over the first electrically insulating layer, depositing a second thin layer of electrically insulating material over the electrically conductive layer. An overlying thickness of the coating material is deposited over the second thin layer of electrically insulating material. The thicknesses of the insulating and conducting layers is controlled to be small enough such that the overlying coating surface exposed to mechanical wear retains a desired degree of smoothness without the necessity for a separate planarization step.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.