System and method for automated selection of testing criteria for payment devices
US8132713B2 · kind B2 · utility
7Cited by
4References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 23, 2010 |
| Grant date | Mar 13, 2012 |
| Priority date | — |
| Expiry date | Sep 10, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q20/405
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
System and methods for generating one more tests to be performed on a payment device are provided. A vendor selects one or more features to be included in his payment device and provides that information to the system. The system analyzes the information and provides a list of tests to be performed on the reference payment device. In addition, the system also provides a list of one or more reference payment device configurations provided for testing purposes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.