X-ray tomography inspection systems
US8135110B2 · kind B2 · utility
63Cited by
294References
16Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 19, 2008 |
| Grant date | Mar 13, 2012 |
| Priority date | — |
| Expiry date | Jun 19, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/643
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is an X-ray scanning system with an X-ray source arranged to generate X-rays from X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, a second set of detectors arranged to detect X-rays scattered within the scanning region, and a processor arranged to process outputs from the detectors to generate image data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.