Patent · US Active

In-circuit test assembly

US8138776B2 · kind B2 · utility

0Cited by

9References

20Claims

0Family size

Inventors

Robert C. Shelsky · Nashua, US
Kenneth W. Graham · Buckhurst Hill, GB
Dennis D. Everson · Banks, US

Key dates

Filing date	Jun 30, 2009
Grant date	Mar 20, 2012
Priority date	—
Expiry date	Aug 24, 2030

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10T29/49155
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test assembly that may provide access to signals of a circuit that includes an integrated circuit. The test assembly may include structural members that limit movement of components relative to each other.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.