Patent · US Active

Handler for electronic components, in particular IC's, comprising circulating units, the temperature of which can be controlled

US8138779B2 · kind B2 · utility

0Cited by

7References

19Claims

0Family size

Assignee

Multitest Elektronische Systeme GmbH · DE

Inventors

Stefan Thiel · Rosenheim, DE
Franz Pichl · Teupitz, DE
Günther Jeserer · Kolbermoor, DE
Andreas Wiesböck · Stephanskirchen, DE

Key dates

Filing date	Sep 25, 2008
Grant date	Mar 20, 2012
Priority date	—
Expiry date	Oct 12, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2893
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A handler for electronic components, in particular IC's, for controlling the temperature of the components and supplying and removing said components to and from a test device has circulating units that can be moved along a circulating track. Each unit has at least one retaining unit for retaining a component. In addition, the circulating units have temperature-control chambers containing components that are retained by the retaining units, so that the temperature of the components can be controlled during transport from the charging station to the test station.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.