Automatic classification of defects
US8140514B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 26, 2008 |
| Grant date | Mar 20, 2012 |
| Priority date | — |
| Expiry date | Jul 31, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/008
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of automatically classifying defects. The method generally includes the steps of (A) receiving information for a current defect, (B) extracting field values from the current defect, (C) counting a number of occurrences of one or more keywords in the current defect, (D) determining one or more new keywords occurring in the current defect and storing the one or more new keywords in a database and (E) creating one or more linkages in the database between a first record corresponding to the current defect and one or more second records corresponding to previous defects based upon one or more similarities between the first and the second records.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.